Reexamination of N composition dependence of coherently grown GaNAs band gap energy with high-resolution x-ray diffraction mapping measurements
نویسندگان
چکیده
منابع مشابه
High-resolution X-ray diffraction and imaging
This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 1999
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.123516